Structural and electronic properties of CuInSe2
Identifieur interne : 000668 ( Main/Exploration ); précédent : 000667; suivant : 000669Structural and electronic properties of CuInSe2
Auteurs : RBID : ISTEX:11664_1985_Article_BF02661224.pdfEnglish descriptors
Abstract
Structural investigation on monocrystalline CuInSe2 samples has been made. From the single crystal results, the space group of CuInSe2 was confirmed to be I¯42d and the crystal solidification direction was investigated. Compositional uniformity of the ingots was established by EPMA and it was found that the indium concentration was greater than that for copper. Systematic annealing experiments were carried out in vacuum at different temperatures (as low as 160° C) and for different times. Large variation in resistivity was observed after the annealing treatment. P-type samples were found to convert to n-type after the heat-treatments.
DOI: 10.1007/BF02661224
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<author><name>I. Shih</name>
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<author><name>T. Araki</name>
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<author><name>C. H. Champness</name>
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<front><div type="abstract" xml:lang="eng">Structural investigation on monocrystalline CuInSe2 samples has been made. From the single crystal results, the space group of CuInSe2 was confirmed to be I¯42d and the crystal solidification direction was investigated. Compositional uniformity of the ingots was established by EPMA and it was found that the indium concentration was greater than that for copper. Systematic annealing experiments were carried out in vacuum at different temperatures (as low as 160° C) and for different times. Large variation in resistivity was observed after the annealing treatment. P-type samples were found to convert to n-type after the heat-treatments.</div>
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<abstract lang="eng">Structural investigation on monocrystalline CuInSe2 samples has been made. From the single crystal results, the space group of CuInSe2 was confirmed to be I¯42d and the crystal solidification direction was investigated. Compositional uniformity of the ingots was established by EPMA and it was found that the indium concentration was greater than that for copper. Systematic annealing experiments were carried out in vacuum at different temperatures (as low as 160° C) and for different times. Large variation in resistivity was observed after the annealing treatment. P-type samples were found to convert to n-type after the heat-treatments.</abstract>
<subject lang="eng"><genre>Key words</genre>
<topic>Copper indium diselenide</topic>
<topic>structural and electrical properties</topic>
<topic>annealing effects</topic>
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<relatedItem type="series"><titleInfo type="abbreviated"><title>JEM</title>
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<titleInfo><title>Journal of Electronic Materials</title>
<partNumber>Year: 1985</partNumber>
<partNumber>Volume: 14</partNumber>
<partNumber>Number: 3</partNumber>
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<originInfo><dateIssued encoding="w3cdtf">1985-05-01</dateIssued>
<copyrightDate encoding="w3cdtf">1985</copyrightDate>
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<topic>Optical and Electronic Materials</topic>
<topic>Characterization and Evaluation of Materials</topic>
<topic>Solid State Physics and Spectroscopy</topic>
<topic>Electronics and Microelectronics, Instrumentation</topic>
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<identifier type="issn">0361-5235</identifier>
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<part><extent unit="pages"><start>297</start>
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